Precision Ion Milling System Ⅱ

• Ion polishing by two miniature Penning ion guns (PIGs) aimed at
  glancing angles of incidence to the specimen
• Minimization of radiation damage and beam heating
• Producing specimens having exceptionally, large, clean electron transparent areas
• Specimen preparation times for dimpled specimens: from 0.5 to 2 hours
  depending on the initial specimen thickness
• Single side specimen post in order to minimize specimen contamination
  by secondary sputtering and provides an excellent heat sink which
  stops specimens from becoming overheated by the ion beam
• Autotermintion prior to perforation
• Pneumatic Sputter Shield