Energy Materials and Electron Microscopy Group

Facility

Facility

그림2.png

High-Resolution Transmission Electron Microscope (Jeol JEM 3010)

 

Configuration

Version

UHR

Resolution

Point image

0.17nm

Lattice image

0.14nm

Accelerating voltage

100, 150, 200, 250, 300KV

Spot size

TEM mode

200 ~ 20nm (5)

EDS/NBD/CBD mode

25 ~ 1.0nm (5)

CBDE

Convergent angle

15 ~ 20mrd more

Acceptance anlge

Max. 20°

Magnification (Steps)

Low MAG mode

50 ~ 10,000X (20)

MAG mode

4,000 ~ 1,500,000(27)

SA MAG ode

10,000 ~ 1,000,000(21)

Camera length (Steps)

SA DIFF mode

120 ~ 3,000nm(15)

Specimen chamber

Specimen tilt angle

+/-20°


  1. Chemical vapor deposition (CVD)

  2. Transmission electron microscope (TEM)

  3. Electrochemical cell tester

  4. Precision Ion Milling System Ⅱ

  5. Electrospinning

  6. Plasma cleaner

Board Pagination Prev 1 2 Next
/ 2