High-Resolution Transmission Electron Microscope (Jeol JEM 3010)
Configuration
|
Version
|
UHR
|
Resolution
|
Point image
|
0.17nm
|
Lattice image
|
0.14nm
|
Accelerating voltage
|
100, 150, 200, 250, 300KV
|
Spot size
|
TEM mode
|
200 ~ 20nm (5)
|
EDS/NBD/CBD mode
|
25 ~ 1.0nm (5)
|
CBDE
|
Convergent angle
|
15 ~ 20mrd more
|
Acceptance anlge
|
Max. 20°
|
Magnification (Steps)
|
Low MAG mode
|
50 ~ 10,000X (20)
|
MAG mode
|
4,000 ~ 1,500,000(27)
|
SA MAG ode
|
10,000 ~ 1,000,000(21)
|
Camera length (Steps)
|
SA DIFF mode
|
120 ~ 3,000nm(15)
|
Specimen chamber
|
Specimen tilt angle
|
+/-20°
|
|