Energy Materials and Electron Microscopy Group

Facility

Facility

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High-Resolution Transmission Electron Microscope (Jeol JEM 3010)

 

Configuration

Version

UHR

Resolution

Point image

0.17nm

Lattice image

0.14nm

Accelerating voltage

100, 150, 200, 250, 300KV

Spot size

TEM mode

200 ~ 20nm (5)

EDS/NBD/CBD mode

25 ~ 1.0nm (5)

CBDE

Convergent angle

15 ~ 20mrd more

Acceptance anlge

Max. 20°

Magnification (Steps)

Low MAG mode

50 ~ 10,000X (20)

MAG mode

4,000 ~ 1,500,000(27)

SA MAG ode

10,000 ~ 1,000,000(21)

Camera length (Steps)

SA DIFF mode

120 ~ 3,000nm(15)

Specimen chamber

Specimen tilt angle

+/-20°


List of Articles
번호 제목 글쓴이 날짜 조회 수
16 Vacuum Oven file 관리자 2016.08.16 673
» Transmission electron microscope (TEM) file 관리자 2016.08.04 7100
14 Single tilt Holder (JEOL) file 관리자 2018.11.20 1227
13 RTA (Rapid Thermal Annealing) file 관리자 2016.08.16 764
12 Precision Ion Milling System Ⅱ file 관리자 2016.07.21 318
11 Plasma cleaner file 관리자 2016.07.21 334
10 Nanofactory Holder file 관리자 2018.11.20 432
9 Liquid Holder (Protochips) file 관리자 2018.11.20 182
8 Heating Holder (Protochips) file 관리자 2018.11.20 244
7 Glove box file 관리자 2016.08.04 73321
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